PSYCH OpenIR  > 中国科学院行为科学重点实验室
Long-term academic stress increases the late component of error processing: An ERP study
Wu Jianhui1; Yuan Yiran1,2; Duan Hongxia1,2; Qin Shaozheng3; Buchanan, Tony W.4; Zhang Kan1; Zhang Liang1
第一作者Wu Jianhui
通讯作者邮箱zhangl@psych.ac.cn
心理所单位排序1
摘要

Exposure to long-term stress has a variety of consequences on the brain and cognition. Few studies have examined the influence of long-term stress on event related potential (ERP) indices of error processing. The current study investigated how long-term academic stress modulates the error related negativity (Ne or ERN) and the error positivity (Pe) components of error processing. Forty-one male participants undergoing preparation for a major academic examination and 20 non-exam participants completed a Go-NoGo task while ERP measures were collected. The exam group reported higher perceived stress levels and showed increased Pe amplitude compared with the non-exam group. Participants' rating of the importance of the exam was positively associated with the amplitude of Pe, but these effects were not found for the Ne/ERN. These results suggest that long-term academic stress leads to greater motivational assessment of and higher emotional response to errors. (C) 2014 Elsevier B.V. All rights reserved.

关键词Long-term academic stress Error processing ERP Ne/ERN Pe
2014-05-01
DOI10.1016/j.biopsycho.2014.03.002
发表期刊BIOLOGICAL PSYCHOLOGY
ISSN0301-0511
卷号99期号:0页码:77-82
收录类别SCI
WOS研究方向Psychology ; Behavioral Sciences
WOS类目Psychology, Biological ; Behavioral Sciences ; Psychology ; Psychology, Experimental
WOS记录号WOS:000335928700009
WOS分区Q1
引用统计
被引频次:29[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.psych.ac.cn/handle/311026/14110
专题中国科学院行为科学重点实验室
通讯作者Zhang Liang
作者单位1.Chinese Acad Sci, Inst Psychol, Key Lab Behav Sci, Beijing 100101, Peoples R China
2.Univ Chinese Acad Sci, Beijing, Peoples R China
3.Stanford Univ, Sch Med, Dept Psychiat & Behav Sci, Stanford, CA 94305 USA
4.St Louis Univ, Dept Psychol, St Louis, MO 63103 USA
第一作者单位中国科学院行为科学重点实验室
通讯作者单位中国科学院行为科学重点实验室
推荐引用方式
GB/T 7714
Wu Jianhui,Yuan Yiran,Duan Hongxia,et al. Long-term academic stress increases the late component of error processing: An ERP study[J]. BIOLOGICAL PSYCHOLOGY,2014,99(0):77-82.
APA Wu Jianhui.,Yuan Yiran.,Duan Hongxia.,Qin Shaozheng.,Buchanan, Tony W..,...&Zhang Liang.(2014).Long-term academic stress increases the late component of error processing: An ERP study.BIOLOGICAL PSYCHOLOGY,99(0),77-82.
MLA Wu Jianhui,et al."Long-term academic stress increases the late component of error processing: An ERP study".BIOLOGICAL PSYCHOLOGY 99.0(2014):77-82.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
WOS_000335928700009.(734KB)期刊论文出版稿暂不开放CC BY-NC-SA请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Wu Jianhui]的文章
[Yuan Yiran]的文章
[Duan Hongxia]的文章
百度学术
百度学术中相似的文章
[Wu Jianhui]的文章
[Yuan Yiran]的文章
[Duan Hongxia]的文章
必应学术
必应学术中相似的文章
[Wu Jianhui]的文章
[Yuan Yiran]的文章
[Duan Hongxia]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。