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题名:
Long-term academic stress increases the late component of error processing: An ERP study
作者: Wu Jianhui1; Yuan, YiRan(袁怡然)1,2; Duan Hongxia1,2; Qin Shaozheng3; Buchanan, Tony W.4; Zhang Kan1; Zhang, Liang(张亮)1
文章类型: Article
关键词: Long-term academic stress ; Error processing ; ERP ; Ne/ERN ; Pe
刊名: BIOLOGICAL PSYCHOLOGY
ISSN号: 0301-0511
出版日期: 2014-05-01
卷号: 99, 期号:0, 页码:77-82
收录类别: SSCI
英文摘要: Exposure to long-term stress has a variety of consequences on the brain and cognition. Few studies have examined the influence of long-term stress on event related potential (ERP) indices of error processing. The current study investigated how long-term academic stress modulates the error related negativity (Ne or ERN) and the error positivity (Pe) components of error processing. Forty-one male participants undergoing preparation for a major academic examination and 20 non-exam participants completed a Go-NoGo task while ERP measures were collected. The exam group reported higher perceived stress levels and showed increased Pe amplitude compared with the non-exam group. Participants' rating of the importance of the exam was positively associated with the amplitude of Pe, but these effects were not found for the Ne/ERN. These results suggest that long-term academic stress leads to greater motivational assessment of and higher emotional response to errors. (C) 2014 Elsevier B.V. All rights reserved.
语种: 英语
WOS记录号: WOS:000335928700009
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.psych.ac.cn/handle/311026/14110
Appears in Collections:中国科学院行为科学重点实验室_期刊论文

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作者单位: 1.Chinese Acad Sci, Inst Psychol, Key Lab Behav Sci, Beijing 100101, Peoples R China
2.Univ Chinese Acad Sci, Beijing, Peoples R China
3.Stanford Univ, Sch Med, Dept Psychiat & Behav Sci, Stanford, CA 94305 USA
4.St Louis Univ, Dept Psychol, St Louis, MO 63103 USA

Recommended Citation:
Wu Jianhui,Yuan Yiran,Duan Hongxia,et al. Long-term academic stress increases the late component of error processing: An ERP study[J]. BIOLOGICAL PSYCHOLOGY,2014,99(0):77-82.
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