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题名:
Short-term test-retest reliability of resting state fMRI metrics in children with and without attention-deficit/hyperactivity disorder
作者: Somandepalli, Krishna1; Kelly, Clare1; Reiss, Philip T.2,3; Xi-Nian Zuo(左西年)4,5; Craddock, R. C.6,7; Yang Chaogan(严超赣)1,3,4,5; Petkova, Eva2,3; Castellanos, F. X.1,3; Milham, Michael P.6,7; Di Martino, Adriana
文章类型: Article
关键词: Test-retest reliability ; Intraclass correlation coefficient ADHD ; Resting state fMRI ; Image intraclass correlation coefficient (I2C2)
刊名: DEVELOPMENTAL COGNITIVE NEUROSCIENCE
ISSN号: 1878-9293
出版日期: 2015-10-01
卷号: 15, 期号:0, 页码:83-93
收录类别: SCI
英文摘要: To date, only one study has examined test-retest reliability of resting state fMRI (R-fMRI) in children, none in clinical developing groups. Here, we assessed short-term test-retest reliability in a sample of 46 children (11-17.9 years) with attention-deficit/hyperactivity disorder (ADHD) and 57 typically developing children (TDC). Our primary test-retest reliability measure was the intraclass correlation coefficient (ICC), quantified for a range of R-fMRI metrics. We aimed to (1) survey reliability within and across diagnostic groups, and (2) compare voxel-wise ICC between groups. We found moderate-to-high ICC across all children and within groups, with higher-order functional networks showing greater ICC. Nearly all R-fMRI metrics exhibited significantly higher ICC in TDC than in children with ADHD for one or more regions. In particular, posterior cingulate and ventral precuneus exhibited group differences in ICC across multiple measures. In the context of overall moderate-to-high test-retest reliability in children, regional differences in ICC related to diagnostic groups likely reflect the underlying pathophysiology for ADHD. Our currently limited understanding of the factors contributing to inter- and intra-subject variability in ADHD underscores the need for large initiatives aimed at examining their impact on test-retest reliability in both clinical and developing populations. (C) 2015 Published by Elsevier Ltd.
语种: 英语
WOS记录号: WOS:000364537300008
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.psych.ac.cn/handle/311026/15319
Appears in Collections:中国科学院行为科学重点实验室_期刊论文

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作者单位: 1.NYU, Langone Med Ctr, Ctr Child Study, Phyllis Green & Randolph Cowen Inst Pediat Neuros, New York, NY 10016 USA
2.NYU, Ctr Child Study, Langone Med Ctr, Div Biostat, New York, NY 10016 USA
3.Nathan S Kline Inst Psychiat Res, Orangeburg, NY USA
4.Chinese Acad Sci, Inst Psychol, Key Lab Behav Sci, Beijing 100101, Peoples R China
5.Chinese Acad Sci, Inst Psychol, Magnet Resonance Imaging Res Ctr, Beijing 100101, Peoples R China
6.Child Mind Inst, Ctr Developing Brain, New York, NY 10022 USA
7.Nathan S Kline Inst Psychiat Res, Ctr Biomed Imaging & Neuromodulat, Orangeburg, NY USA

Recommended Citation:
Somandepalli, Krishna,Kelly, Clare,Reiss, Philip T.,et al. Short-term test-retest reliability of resting state fMRI metrics in children with and without attention-deficit/hyperactivity disorder[J]. DEVELOPMENTAL COGNITIVE NEUROSCIENCE,2015,15(0):83-93.
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文件名: Short-term test-retest reliability of resting state fMRI metrics in children with and without attention-deficithyperactivity disorder.pdf
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